Antenna Calibration for Near-Field Material Characterization


Antenna Calibration for Near-Field Material Characterization


A novel antenna calibration methodology is presented for close to-field problems, like material characterization or inverse scattering. The procedure accurately accounts for variations between simulations of objects close to antennas and the equivalent experimental measurements. It’s based on the strategy of moments (MoM) resolution to surface integral scattering equations. An economical selection of macrobasis functions (MBFs) is applied to the antenna, that reduces the computational prices by many orders of magnitude. The calibration involves scanning a target of known constitution through the antenna close to field, assigning a tuning parameter to every MBF and optimizing said parameters, so as to cut back the error between antenna simulations and measurements. This adjusts the antenna’s simulated surface currents, therefore as to additional accurately represent the currents on the experimental apparatus. Therefore, an efficient antenna model is obtained, that more accurately represents the real-world antenna. The calibration technique is verified by applying it to the characterization of dielectric objects of known but arbitrary shape.

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