The work describes the development of a reliable device for profiling anion beam in the intensity cross section. A sensor head consisting of a Faraday cup in combination with a Channel Electron Multiplier was designed and built together with electronics including power supply and front end electronics.
The design was chosen considering financial and long term life aspects. Testing, first calibration and error analysis were done using the ion beam facilities where the unit is supposed to be installed permanently. The profiling system performed as designed and the profile of the ion beam could be measured reliably with an accuracy down to the fem to ampere range.
Source: Halmstad University
Author: Stude, Joan