Scattering From Two Rough Surfaces With Inhomogeneous Dielectric Profiles


Scattering From Two Rough Surfaces With Inhomogeneous Dielectric Profiles


A rigorous analytical technique to derive the scattering coefficients of three-dimensional (3D) 2 rough surfaces with arbitrary dielectric profiles is presented. The proposed technique applies a perturbation approach to a surface integral equation (IE) formulation that’s derived from the extended boundary conditions (EBC). 1st, using EBC or the surface equivalence principle (SEP) and therefore the dyadic Green’s functions of the resulting less complicated geometries, a system of IEs for the surface fields of the two rough interfaces is established. Then, the Fourier-domain surface fields are derived using a perturbation technique. The scattered fields are subsequently determined by a second application of SEP. In general, the approach might be used to present the final formulation for multiple rough layers and conjointly higher order solutions. However, the focus of this paper is on deriving compact closed-type solutions for inhomogeneous dielectric profiles and so, solely two rough interfaces are thought-about. Accordingly, the first-order closed-type scattered fields are represented during a remarkably compact form that is appropriate for physical interpretation and additionally extension to higher orders. Finally, the derived expressions are compared to known solutions of special cases, offered in the literature. The results are shown to be specifically in keeping with existing ones and hence validated analytically and numerically.

Did you like this research project?

To get this research project Guidelines, Training and Code… Click Here


Leave a Reply

Your email address will not be published. Required fields are marked *

− one = one