Skewed-Load Test Cubes Based on Functional Broadside Tests for a Low-Power Test Set – 2015

PROJECT TITLE:

Skewed-Load Test Cubes Based on Functional Broadside Tests for a Low-Power Test Set – 2015

ABSTRACT:

A low-power test generation procedure that was developed earlier merges broadside check cubes that are derived from purposeful broadside tests so as to get a low-power broadside take a look at set. This has many advantages, most significantly, that take a look at cubes, that are derived from practical broadside tests, create practical operation conditions in subcircuits around the sites of detected faults. These conditions are preserved when a test cube is merged with alternative check cubes. This brief applies the same approach to the generation of an occasional-power skewed-load check set. The main challenge that this project addresses is the derivation of skewed-load test cubes from useful broadside tests. The project also considers the percentages of values that should be unspecified within the skewed-load test cubes in order to balance the requirement to form purposeful operation conditions with the necessity for test compaction.

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